OAL - Cache Tests (Compact 2013)

OAL Cache Churn Test

Causes churn of the memory hierarchy and cache systems by mixing operations such as allocation, freedom, and reading and writing on blocks of memory

Real-Time Data-Cache-Size Calculation Test

Calculate the size of the L1 data cache while the Windows Embedded Compact device is used

Write-through Cache Mode Tests

Expose problems in the kernel, OEM adaptation layer (OAL) cache implementation, hardware cache implementation, and memory chips